Recent advances in electron microscopy and nanotechnology, namely the field emission gun and
the focused ion beam, have made it easier to conduct electron interference experiments
with multiple slits. We can now conduct these experiments using a conventional transmission electron microscope. Using this technology allows us
to explore a large range of images, from images of the slits to their Fraunhofer diffraction patterns
through Fresnel diffraction images.
By changing the number of slits we can see varying diffraction results. Looking at the
image below, we can see the contrasting results from using a single slit versus using a double slit setup. Performing these experiments and getting these images allows for a quantitative analysis of electron intensity and observation of electron wave behavior.
Frigeri, Gian Carlo Gazzadi, and Giulio Pozzi (Link
Pattern comparison image taken from Wikipedia (Link