Recent advances in electron microscopy and nanotechnology, namely the field emission gun and the focused ion beam, have made it easier to conduct electron interference experiments with multiple slits. We can now conduct these experiments using a conventional transmission electron microscope. Using this technology allows us to explore a large range of images, from images of the slits to their Fraunhofer diffraction patterns through Fresnel diffraction images.

Slit Diffraction

   By changing the number of slits we can see varying diffraction results. Looking at the image below, we can see the contrasting results from using a single slit versus using a double slit setup. Performing these experiments and getting these images allows for a quantitative analysis of electron intensity and observation of electron wave behavior.

Diffraction with single slit (top) and double slit (bottom).